Size-effect of Kondo scattering in point contacts (revisited)
Электpонные свойства металлов и сплавов
DOI (Low Temperature Physics):
https://doi.org/10.1063/1.593630Ключові слова:
PACS: 72.15.Qm,72.10.Fk,73.40.Ty,75.20. HrАнотація
The size-effect of Kondo-scattering in nanometer-sized metallic point contacts is measured with the simplified, mechanically-controlled break-junction technique for CuMn alloy of different Mn concentrations: 0.017; 0.035; and 0.18 (± 0.017) at.%. The results are compared with our previous publication on nominally 0.1 at.% CuMn alloy [1,2]. The increase of width of the Kondo resonance and enhanced ratio of Kondo-peak intensity to electron-phonon scattering intensity is observed for contacts with sizes smaller than 10 nm. From the comparison of electron-phonon scattering intensity for the pressure-type contacts, which correspond to the clean orifice model, we conclude that the size effect is observed in clean contacts with the shape of a channel (nanowire).Завантаження
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1998-07-10
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I. K. Yanson, V. V. Fisun, N. L. Bobrov, J. A. Mydosh, and J. M. van Ruitenbeek, Size-effect of Kondo scattering in point contacts (revisited): Электpонные свойства металлов и сплавов, Low Temp. Phys. 24, (1998) [Fiz. Nizk. Temp. 24, 654-660, (1998)] DOI: https://doi.org/10.1063/1.593630.
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