T. V. . Veremeichyk, O. V. . Makarenko, V. B. . Shevchenko, S. Y. . Ivanchuk, і A. V. . Rybalochka, «Investigation of multilayer samples of porous silicon with periodic structure by spectroscopic ellipsometry », Fiz. Nyzk. Temp., вип. 51, вип. 2, с. 261–266, Груд 2024.