Veremeichyk TV, Makarenko OV, Shevchenko VB, Ivanchuk SY, Rybalochka AV. Investigation of multilayer samples of porous silicon with periodic structure by spectroscopic ellipsometry . Fiz. Nyzk. Temp. [інтернет]. 23, Грудень 2024 [цит. за 10, Листопад 2025];51(2):261–266. доступний у: http://80.92.230.95/index.php/fnt/article/view/9404